Olympus this week announced the release of the LEXT OLS4100 laser
confocal microscope system. Designed to deliver nanometer-level imaging,
accurate 3D measurement, and outstanding surface roughness analysis,
the OLS4100 features auto brightness and a new high-speed stitching
mode.
Engineered to meet a growing demand for increased
measurement precision and wider observation applicability, the OLS4100
offers advanced measurement performance at ten-nanometer resolution with
a variety of user-friendly performance parameters. Thanks to high
numerical apertures and a dedicated optical system that obtains maximum
performance from a 405 nm laser, the OLS4100 can reliably measure
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development across an array of industries and applications, OLYMPUS LEXT
laser microscopes set a new standard in 3D laser microscopy,” said Matt
Smith, Olympus director of sales and marketing. “Today,Most of
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motorcycle are similar or the same with following one. with the LEXT
OLS4100, Olympus is once again raising the bar with a new level of
precision and ease of use.”
The OLS4100’s auto brightness
setting is part of an automatic 3D image acquisition system that allows
even first-time users to quickly acquire 3D images with the click of a
button, greatly reducing image acquisition time. A new high-speed
stitching mode allows the user to specify target areas from wider-area
stitched images.
The OLS4100 employs a dual confocal system
that, when combined with its high-sensitivity detector, enables the
capture of clear images from samples consisting of materials with
different reflectance characteristics. In addition to the laser image,
the OLS4100 uses a white LED light and a high-color-fidelity CCD camera
to generate clear, natural-looking color imagery comparable with that
obtained with high-grade optical microscopes. This color image can be
overlaid upon the 3D laser image for a 3D representation of your
sample.
The OLS4100’s new multilayer mode is capable of
recognizing the peaks of reflected light intensities of multiple sample
layers and setting each layer as a focal point, making it possible to
observe and measure the upper and lower surfaces of a sample with a
transparent coating. This multilayer mode also facilitates the
observation and measurement of multiple layers of transparent
materials.
Calibrated in the same way as contact surface
roughness gauges, the OLS4100 represents a new level of surface
roughness measuring and adheres to the necessary roughness parameters
and filters required per ISO and JQA. This allows users with contact
surface roughness gauges to obtain output results from the OLS4100
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